期刊书目 › ENGINEERING, ELECTRICAL & ELECTRONIC(工程，电气和电子) › SCIE期刊IEEE Design & Test 2024/2025影响因子:1.909 (IEEE DES TEST) (2168-2356). (ENGINEERING, ELECTRICAL & ELECTRONIC)(工程，电气和

PAGAN 发表于 2025-3-23 11:01:01

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Indigence 发表于 2025-3-23 17:40:45

Submitted on: 30 August 2010.
Revised on: 24 October 2010.
Accepted on: 20 November 2010.

___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

挫败 发表于 2025-3-23 21:33:49

Submitted on: 02 January 2004.
Revised on: 15 February 2004.
Accepted on: 05 March 2004.

___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Original 发表于 2025-3-24 00:37:55

Submitted on: 03 January 2014.
Revised on: 16 February 2014.
Accepted on: 01 March 2014.

___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

DAUNT 发表于 2025-3-24 06:19:21

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动物 发表于 2025-3-24 08:18:52

Submitted on: 25 July 2000.
Revised on: 07 November 2000.
Accepted on: 17 December 2000.

___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

祸害隐伏 发表于 2025-3-24 10:55:24

Submitted on: 23 November 2021.
Revised on: 15 March 2022.
Accepted on: 23 April 2022.

___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

卷发 发表于 2025-3-24 18:50:54

Submitted on: 17 February 2016.
Revised on: 16 May 2016.
Accepted on: 26 June 2016.

___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

陈旧 发表于 2025-3-24 19:18:29

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engagement 发表于 2025-3-25 01:53:32

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