centipede 发表于 2025-3-21 16:18:08

书目名称Surface Analysis Methods in Materials Science影响因子(影响力)<br>        http://impactfactor.cn/if/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science影响因子(影响力)学科排名<br>        http://impactfactor.cn/ifr/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science网络公开度<br>        http://impactfactor.cn/at/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science网络公开度学科排名<br>        http://impactfactor.cn/atr/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science被引频次<br>        http://impactfactor.cn/tc/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science被引频次学科排名<br>        http://impactfactor.cn/tcr/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science年度引用<br>        http://impactfactor.cn/ii/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science年度引用学科排名<br>        http://impactfactor.cn/iir/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science读者反馈<br>        http://impactfactor.cn/5y/?ISSN=BK0882229<br><br>        <br><br>书目名称Surface Analysis Methods in Materials Science读者反馈学科排名<br>        http://impactfactor.cn/5yr/?ISSN=BK0882229<br><br>        <br><br>

narcotic 发表于 2025-3-21 22:53:16

http://reply.papertrans.cn/89/8823/882229/882229_2.png

Isthmus 发表于 2025-3-22 02:53:00

978-3-642-07458-5Springer-Verlag Berlin Heidelberg 2003

事情 发表于 2025-3-22 05:22:08

Surface Analysis Methods in Materials Science978-3-662-05227-3Series ISSN 0931-5195 Series E-ISSN 2198-4743

四目在模仿 发表于 2025-3-22 08:53:35

http://reply.papertrans.cn/89/8823/882229/882229_5.png

全能 发表于 2025-3-22 14:03:14

http://reply.papertrans.cn/89/8823/882229/882229_6.png

完整 发表于 2025-3-22 18:31:39

http://reply.papertrans.cn/89/8823/882229/882229_7.png

Soliloquy 发表于 2025-3-23 00:43:38

http://reply.papertrans.cn/89/8823/882229/882229_8.png

agitate 发表于 2025-3-23 04:28:03

http://reply.papertrans.cn/89/8823/882229/882229_9.png

Memorial 发表于 2025-3-23 08:48:01

Sputter Depth Profilingand so does not significantly alter bulk atomic concentrations. (math) and Cs. are favoured for SIMS since they increase secondary ion yields and reduce matrix effects. However, this is at the price of reduced sputter rates and profile distortion though compound formation and segregation. Liquid met
页: [1] 2 3 4 5 6
查看完整版本: Titlebook: Surface Analysis Methods in Materials Science; D. John O’Connor,Brett A. Sexton,Roger St. C. Smar Book 2003Latest edition Springer-Verlag