centipede 发表于 2025-3-21 16:18:08
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978-3-642-07458-5Springer-Verlag Berlin Heidelberg 2003事情 发表于 2025-3-22 05:22:08
Surface Analysis Methods in Materials Science978-3-662-05227-3Series ISSN 0931-5195 Series E-ISSN 2198-4743四目在模仿 发表于 2025-3-22 08:53:35
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Sputter Depth Profilingand so does not significantly alter bulk atomic concentrations. (math) and Cs. are favoured for SIMS since they increase secondary ion yields and reduce matrix effects. However, this is at the price of reduced sputter rates and profile distortion though compound formation and segregation. Liquid met