KEN 发表于 2025-3-21 18:19:00

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paltry 发表于 2025-3-21 20:29:04

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LUDE 发表于 2025-3-22 01:21:27

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anus928 发表于 2025-3-22 07:27:30

https://doi.org/10.1007/978-1-4757-2611-4CMOS; DRAM; Leistungsfeldeffekttransistor; RAM; VLSI; field-effect transistor; metal oxide semiconductur f

trigger 发表于 2025-3-22 09:24:30

Springer-Verlag US 1997

Migratory 发表于 2025-3-22 12:58:11

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极深 发表于 2025-3-22 20:03:04

Book 1997Latest editionI device processing, the physics of the SOI MOSFET as well as thatof SOI other devices, and the performances of SOI circuits arediscussed in detail. .The SOI specialist will find this book invaluable as a source ofcompiled references covering the different aspects of SOI technology.For the non-speci

GAVEL 发表于 2025-3-22 21:22:08

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减弱不好 发表于 2025-3-23 03:23:47

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较早 发表于 2025-3-23 09:15:02

Jean-Pierre Colingension or the P-dimension. Moreover, we will see in Chapter 8 that, under suitable conditions, a little prior knowledge about the probability does not really help, in the following sense: Learning when there is so-called nonparametric uncertainty about the underlying probability measure is as difficu
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查看完整版本: Titlebook: Silicon-on-Insulator Technology; Materials to VLSI Jean-Pierre Colinge Book 1997Latest edition Springer-Verlag US 1997 CMOS.DRAM.Leistungsf