insular 发表于 2025-3-26 21:15:06
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Field Emission Microscopy for Analysis of Semiconductor Surfaces control of the surface: cleanliness, adsorption zones, degree of coverage, etc… Since field emission depends primarily on the wave functions of the electrons as they extend into vacuum, these studies can be completed with interest in a following step by Fowler-Nordheim I-V characteristics analysis.故意钓到白杨 发表于 2025-3-28 01:48:58
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