insular 发表于 2025-3-26 21:15:06

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健壮 发表于 2025-3-27 04:19:54

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Morsel 发表于 2025-3-27 06:29:09

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Adulate 发表于 2025-3-27 11:49:01

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Congruous 发表于 2025-3-27 14:33:16

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Recessive 发表于 2025-3-27 18:56:42

Field Emission Microscopy for Analysis of Semiconductor Surfaces control of the surface: cleanliness, adsorption zones, degree of coverage, etc… Since field emission depends primarily on the wave functions of the electrons as they extend into vacuum, these studies can be completed with interest in a following step by Fowler-Nordheim I-V characteristics analysis.

故意钓到白杨 发表于 2025-3-28 01:48:58

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deficiency 发表于 2025-3-28 03:10:58

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有危险 发表于 2025-3-28 09:57:52

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syncope 发表于 2025-3-28 13:35:02

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查看完整版本: Titlebook: Semiconductor Interfaces: Formation and Properties; Proceedings of the W Guy Lay,Jacques Derrien,Nino Boccara Conference proceedings 19871s