Racket
发表于 2025-3-21 19:36:40
书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0861170<br><br> <br><br>书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0861170<br><br> <br><br>
恶名声
发表于 2025-3-21 23:53:50
Agnieszka Tomala,Hakan Göçerler,Ille C. Gebeshuberlen Markenführung ergänzt. .Der Inhalt.- Grundlagen der identitätsbasierten Markenführung.- Das Konzept der identitätsbasierten Markenführung.- Strategisches Markenmanagement.- Operatives Markenmanagement.- Ide978-3-658-07506-4
conservative
发表于 2025-3-22 01:08:40
1434-4904 researchers and application scientists from all over the world and from various industries to provide a broader perspective.978-3-662-50725-4978-3-642-25414-7Series ISSN 1434-4904 Series E-ISSN 2197-7127
垫子
发表于 2025-3-22 07:04:53
Exploring Mesoscale Contact Mechanics by Atomic Force Microscopys, is certainly mandatory and highly promising. In this chapter, we present atomic force microscopy as an ideal tool for contact mechanics investigations on individual and multiple contact junctions. In particular, we focus on the fabrication of custom probes, with characteristic size from a few hun
舞蹈编排
发表于 2025-3-22 11:08:11
Atomic Force Microscopy of Isolated Nanostructures: Biomolecular Imaging in Hydrated Environments –important to gain quantitative information about structure and processes on the nanoscale. We also discuss interpretation of height information obtained from AFM on the nanoscale and summarise a framework for recovery of apparent height loss for nanostructures. A combination of these methods will l
北京人起源
发表于 2025-3-22 15:23:31
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critique
发表于 2025-3-22 19:06:42
Nanomechanics of Yeast Surfaces Revealed by AFMthodologies used to perform AFM measurements on live cells, including sample immobilization and tip functionalization.The current status of the progress in probing nanomechanics of the yeast surface is illustrated through three recent breakthrough studies. Determination of the cell wall nanostructur
影响深远
发表于 2025-3-23 00:19:47
Investigation of Nanopatterned Functional Polymer Surfaces by AFM in Pulsed Force Modethe sub-100-nm scale can be probed, which gives new insights into photoinduced processes at the nanoscale.After an introduction focusing on the main techniques used for the analysis of the chemical contrast at micro- and nanopatterned polymer surfaces, the first part will deal with the utility of AF
表示向前
发表于 2025-3-23 01:59:25
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不能逃避
发表于 2025-3-23 07:42:50
Van der Waals and Capillary Adhesion of Polycrystalline Silicon Micromachined Surfacesess increased, the adhesion at a given relative humidity (RH) decreased, while the RH at which adhesion abruptly jumped, or the threshold RH, increased. Once the jump occurred, the adhesion increased toward the upper limit of ., where γ is the liquid-vapor surface energy and θ is the contact angle.