grounded
发表于 2025-3-28 17:26:56
Data Representation and Image ProcessingScanning probe microscopy data usually have the form of a matrix where the topography (height) or some other signal such as the tunneling current, or . is measured as a function of the lateral .-position on the surface.
易于
发表于 2025-3-28 22:22:23
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parsimony
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洞穴
发表于 2025-3-29 03:47:53
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业余爱好者
发表于 2025-3-29 08:58:14
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锡箔纸
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军械库
发表于 2025-3-29 16:25:28
Bert VoigtländerPresents the state-of-the-art in scanning probe techniques.Combines basic physical principles and their application to scanning tunneling and atomic force microscopes.Useful study text for graduate st
禁止
发表于 2025-3-29 22:49:25
978-3-662-50557-1Springer-Verlag Berlin Heidelberg 2015
无能力
发表于 2025-3-30 03:17:22
Scanning Probe Microscopy978-3-662-45240-0Series ISSN 1434-4904 Series E-ISSN 2197-7127
nonsensical
发表于 2025-3-30 07:31:19
Forces Between Tip and Samplebehind the atomic force microscope (AFM) is to measure the force(s) between the surface and the scanning tip in order to track the surface topography. Before we describe the atomic force microscopy technique in detail, we consider the forces acting between tip and sample.