Combat
发表于 2025-3-21 16:47:08
书目名称Scanning Electron Microscopy and X-Ray Microanalysis影响因子(影响力)<br> http://impactfactor.cn/if/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis影响因子(影响力)学科排名<br> http://impactfactor.cn/ifr/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis网络公开度<br> http://impactfactor.cn/at/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis网络公开度学科排名<br> http://impactfactor.cn/atr/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis被引频次<br> http://impactfactor.cn/tc/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis被引频次学科排名<br> http://impactfactor.cn/tcr/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis年度引用<br> http://impactfactor.cn/ii/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis年度引用学科排名<br> http://impactfactor.cn/iir/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis读者反馈<br> http://impactfactor.cn/5y/?ISSN=BK0861151<br><br> <br><br>书目名称Scanning Electron Microscopy and X-Ray Microanalysis读者反馈学科排名<br> http://impactfactor.cn/5yr/?ISSN=BK0861151<br><br> <br><br>
整体
发表于 2025-3-21 21:22:38
Electron Optics,nd spot size are controlled. In this chapter we will discuss the various components of the electron optical system, develop the relationship between electron probe current and spot size, and discuss the factors which influence this relationship.
类似思想
发表于 2025-3-22 03:08:11
Image Formation in the Scanning Electron Microscope,) the origin of the commonly encountered contrast mechanisms which arise from the electron-specimen interaction; (3) the characteristics of detectors for the various signals and their influence on the image; (4) signal quality and its effect on image quality; and (5) signal processing for the final display.
配置
发表于 2025-3-22 05:20:13
Qualitative X-Ray Analysis, considered, errors can arise unless careful attention is paid to the problems of spectral interferences, artifacts, and the multiplicity of spectral lines observed for each element. Because of the differences in approach to qualitative EDS and WDS analysis, these techniques will be treated separately.
慎重
发表于 2025-3-22 09:46:33
by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general intro
saturated-fat
发表于 2025-3-22 13:21:08
X-Ray Spectral Measurement: WDS and EDS,interactions (Chapter 3), which describes the mechanisms for both characteristic and continuum x-ray production. This chapter is concerned with the methods for detecting and measuring these signals as well as converting them into a useful form for qualitative and quantitative analysis.
arthrodesis
发表于 2025-3-22 20:06:18
Practical Techniques of X-Ray Analysis,rly calibrated, (2) the operating conditions are adequate to give sufficient x-ray counts so that a given peak can be easily distinguished from the corresponding background level, and (3) no serious peak overlaps are present.
Gene408
发表于 2025-3-22 23:37:03
http://reply.papertrans.cn/87/8612/861151/861151_8.png
Admonish
发表于 2025-3-23 03:59:08
Book 1981 Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to
哄骗
发表于 2025-3-23 09:31:38
Introduction, submicrometer scale. The scanning electron microscope and electron microprobe are two powerful instruments which permit the observation and characterization of heterogeneous organic and inorganic materials and surfaces on such a local scale. In both instruments, the area to be examined, or the micr