生长变吼叫 发表于 2025-3-21 17:24:13

书目名称Reliability, Yield, and Stress Burn-In影响因子(影响力)<br>        http://impactfactor.cn/if/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In影响因子(影响力)学科排名<br>        http://impactfactor.cn/ifr/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In网络公开度<br>        http://impactfactor.cn/at/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In网络公开度学科排名<br>        http://impactfactor.cn/atr/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In被引频次<br>        http://impactfactor.cn/tc/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In被引频次学科排名<br>        http://impactfactor.cn/tcr/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In年度引用<br>        http://impactfactor.cn/ii/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In年度引用学科排名<br>        http://impactfactor.cn/iir/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In读者反馈<br>        http://impactfactor.cn/5y/?ISSN=BK0826428<br><br>        <br><br>书目名称Reliability, Yield, and Stress Burn-In读者反馈学科排名<br>        http://impactfactor.cn/5yr/?ISSN=BK0826428<br><br>        <br><br>

档案 发表于 2025-3-21 20:24:41

http://reply.papertrans.cn/83/8265/826428/826428_2.png

Ingest 发表于 2025-3-22 01:11:59

Integrating Reliability into Microelectronics Manufacturing,d, which allows no more than 1 particle with 0.1μm diameter per cubic foot. It is now an important agenda to study reliability issues in fabricating microelectronics products and, consequently, the systems that employ high technology such as the new generation of microelectronics. Such an agenda should include:

谈判 发表于 2025-3-22 06:22:03

http://reply.papertrans.cn/83/8265/826428/826428_4.png

吵闹 发表于 2025-3-22 08:57:36

http://reply.papertrans.cn/83/8265/826428/826428_5.png

Perennial长期的 发表于 2025-3-22 14:49:00

http://reply.papertrans.cn/83/8265/826428/826428_6.png

sphincter 发表于 2025-3-22 17:56:53

http://reply.papertrans.cn/83/8265/826428/826428_7.png

commonsense 发表于 2025-3-22 21:59:38

http://reply.papertrans.cn/83/8265/826428/826428_8.png

wangle 发表于 2025-3-23 04:48:18

http://reply.papertrans.cn/83/8265/826428/826428_9.png

女歌星 发表于 2025-3-23 07:43:11

Software Reliability and Infant Mortality Period of the Bathtub Curve,o meet the changing and growing needs of the users . Compiling cost expenditures from all industries, in 1960 about 20% of the system’s cost was spent on software. That percentage has risen to 80% in 1985 and 90% in 1996 . The investment in software increased even more dramatically for the military industry.
页: [1] 2 3 4 5 6
查看完整版本: Titlebook: Reliability, Yield, and Stress Burn-In; A Unified Approach f Way Kuo,Wei-Ting Kary Chien,Taeho Kim Book 1998 Springer Science+Business Medi