Arthr- 发表于 2025-3-23 12:18:36

Time-to-Failure Modeling, to lose their . and become more ., . tend to . and .; etc. All devices (electrical, mechanical, electromechanical, biomechanical, bioelectrical, etc.) will tend to degrade with time and eventually fail.

生锈 发表于 2025-3-23 15:58:57

Gaussian Statistics: An Overview,g the time-zero values of a parameter (resistor values, mechanical tolerances, children heights, class grades on a test, etc.) can result in a distribution of values which can be described by a normal distribution.

accessory 发表于 2025-3-23 18:49:44

http://reply.papertrans.cn/83/8264/826362/826362_13.png

inferno 发表于 2025-3-24 01:20:29

Conversion of Dynamical Stresses into Effective Static Values,ven when we discussed fatigue (a failure mechanism caused by a cyclical stress), it was assumed that the stress range Δσ remained constant with time. However, seldom is the applied stress constant with time, as illustrated in Fig. 1. In integrated circuits, the currents and fields are continually ch

气候 发表于 2025-3-24 03:39:49

Increasing the Reliability of Device/Product Designs,can you make cost-effective design changes to improve the reliability robustness of the device? Often the designer will attempt to answer these questions by stating a safety factor χ which was used for a design..The safety factor, however, is only a qualitative indicator of the reliability margin of

inconceivable 发表于 2025-3-24 06:43:30

Screening,on is indeed a difficult/impossible challenge. Given that all devices will likely have a small fraction of the population which is defective, the question that we want to address in this chapter is: can a relatively .-. be used to eliminate the defective/weak devices without causing significant degr

Assault 发表于 2025-3-24 12:24:39

http://reply.papertrans.cn/83/8264/826362/826362_17.png

纵火 发表于 2025-3-24 17:15:41

Sampling Plans and Confidence Intervals,lity inquiry is often expressed as: what is the defect level for the . of such devices in terms of number of defective devices per hundred, number of defective devices per thousand, number of defective devices per million (dpm), etc.? To determine the ., a sample of the devices is randomly selected

FAZE 发表于 2025-3-24 22:09:50

http://reply.papertrans.cn/83/8264/826362/826362_19.png

monopoly 发表于 2025-3-25 02:54:31

ing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.978-3-319-03329-7978-3-319-00122-7
页: 1 [2] 3 4 5 6
查看完整版本: Titlebook: Reliability Physics and Engineering; Time-To-Failure Mode J. W. McPherson Textbook 20132nd edition Springer International Publishing Switze