Veneer
发表于 2025-3-28 16:04:23
From Material/Device Degradation to Time-to-Failure,esented in Chap. . which can be used for modeling the time-dependence of degradation. The question that we would like to address in this chapter is—.-.-.-.? The time-to-failure (TF) equations are critically important, for device failure mechanisms, and will be the focus of the remaining chapters in this book.
ornithology
发表于 2025-3-28 19:19:32
Gaussian Statistics: An Overview,g the time-zero values of a parameter (resistor values, mechanical tolerances, children heights, class grades on a test, etc.) can result in a distribution of values which can be described by a normal distribution.
臭了生气
发表于 2025-3-29 01:57:26
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instulate
发表于 2025-3-29 06:56:32
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潜伏期
发表于 2025-3-29 09:30:23
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农学
发表于 2025-3-29 11:53:20
Time-Dependence of Materials and Device Degradation,th precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakage, etc.) will degrade with time. In order to understand the useful lifetime of the device, it is important to be able to model how critically important materials/device-parameters degrade with time.
synovial-joint
发表于 2025-3-29 15:42:54
Time-to-Failure Statistics,re. Once the distribution of times-to-failure is established, then one can construct a probability density function .(.) which will permit one to calculate the probability of observing a failure in any arbitrary time interval between t and . + d., as illustrated in Fig. 7.1.
Grievance
发表于 2025-3-29 21:42:28
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退潮
发表于 2025-3-30 02:37:29
Screening,adation to the good/ strong devices? The use of a short-duration stress to eliminate weak devices is generally referred to as .. We will find that screening can sometimes be very effective, but not always. Screening effectiveness depends on the exact details of the . for the devices plus the magnitude and duration of the screening stress.
Angiogenesis
发表于 2025-3-30 07:15:01
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