Ataxia 发表于 2025-3-25 05:39:43

Radiation Effects in Advanced Semiconductor Materials and Devices978-3-662-04974-7Series ISSN 0933-033X Series E-ISSN 2196-2812

描述 发表于 2025-3-25 09:41:05

Cor Claeys,Eddy SimoenThis book summarizes the current knowledge of radiation defects in semiconductors.It will be a useful reference work for scientists involved in semiconductor processing.- This book is important for sp

induct 发表于 2025-3-25 12:17:51

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粗鄙的人 发表于 2025-3-25 17:35:32

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并入 发表于 2025-3-25 21:24:45

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牲畜栏 发表于 2025-3-26 01:58:46

Cor Claeys,Eddy Simoena topic that is usually lost by some at a lower level of sta.Elements of Large-Sample Theory. provides a unified treatment of first- order large-sample theory. It discusses a broad range of applications including introductions to density estimation, the bootstrap, and the asymptotics of survey metho

中止 发表于 2025-3-26 05:08:22

Cor Claeys,Eddy Simoena topic that is usually lost by some at a lower level of sta.Elements of Large-Sample Theory. provides a unified treatment of first- order large-sample theory. It discusses a broad range of applications including introductions to density estimation, the bootstrap, and the asymptotics of survey metho

Indebted 发表于 2025-3-26 09:25:56

Cor Claeys,Eddy Simoena topic that is usually lost by some at a lower level of sta.Elements of Large-Sample Theory. provides a unified treatment of first- order large-sample theory. It discusses a broad range of applications including introductions to density estimation, the bootstrap, and the asymptotics of survey metho

高歌 发表于 2025-3-26 15:07:36

Cor Claeys,Eddy Simoena topic that is usually lost by some at a lower level of sta.Elements of Large-Sample Theory. provides a unified treatment of first- order large-sample theory. It discusses a broad range of applications including introductions to density estimation, the bootstrap, and the asymptotics of survey metho

受伤 发表于 2025-3-26 19:13:22

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查看完整版本: Titlebook: Radiation Effects in Advanced Semiconductor Materials and Devices; Cor Claeys,Eddy Simoen Book 2002 Springer-Verlag Berlin Heidelberg 2002