LIKEN
发表于 2025-3-25 07:06:17
http://reply.papertrans.cn/67/6673/667213/667213_21.png
阴郁
发表于 2025-3-25 07:32:25
NanoScience and Technologyhttp://image.papertrans.cn/n/image/667213.jpg
prick-test
发表于 2025-3-25 12:00:19
https://doi.org/10.1007/978-3-642-56019-4AFM; Bias; Helium-Atom-Streuung; Noncontact atomic; True atomic resolution; deformation; experiment; measur
Fulsome
发表于 2025-3-25 18:17:12
S. Morita,R. Wiesendanger,E. MeyerThis book is a top state-of-the-art report on all the methods in noncontact atomic force microscopy prepared by the leading experts in the field.Includes supplementary material:
DOSE
发表于 2025-3-25 23:51:41
http://reply.papertrans.cn/67/6673/667213/667213_25.png
liaison
发表于 2025-3-26 01:44:26
Principle of NC-AFM, While the STM is an ingenious instrument which has shattered many paradigms about how to access the world of single atoms, the actual device is quite simple and grants an instructive appreciation of the concepts of atomic-scale imaging. The AFM is somewhat more complicated and the additional challe
Mere仅仅
发表于 2025-3-26 04:37:31
http://reply.papertrans.cn/67/6673/667213/667213_27.png
semble
发表于 2025-3-26 11:41:24
Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductor Surfaces,in this book. However, the exact nature of what the NC-AFM image represents is still the subject of some dispute because of the complexity of the interaction between the condensed matter making up the sample and the tip. For example, the Si adatom contrast of Si(111)7x7 as depicted by the NC-AFM doe
分离
发表于 2025-3-26 15:42:49
http://reply.papertrans.cn/67/6673/667213/667213_29.png
联邦
发表于 2025-3-26 16:57:02
http://reply.papertrans.cn/67/6673/667213/667213_30.png