hexagon 发表于 2025-3-21 19:30:12

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监禁 发表于 2025-3-21 20:32:54

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很是迷惑 发表于 2025-3-22 03:44:42

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图表证明 发表于 2025-3-22 05:09:52

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Constituent 发表于 2025-3-22 11:52:39

NC-AFM Imaging of Adsorbed Molecules,oid damage to both the tip apex and the sample surface due to a large loading force, and true atomic resolution has not therefore been achieved. Furthermore, contact AFM sometimes causes local deformation of soft materials and the motion of molecules adsorbed on substrates [.],.].

Mobile 发表于 2025-3-22 16:06:45

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groggy 发表于 2025-3-22 17:16:53

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menopause 发表于 2025-3-22 23:18:03

1434-4904 it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.978-3-642-62772-9978-3-642-56019-4Series ISSN 1434-4904 Series E-ISSN 2197-7127

collagen 发表于 2025-3-23 02:11:25

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季雨 发表于 2025-3-23 06:57:39

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查看完整版本: Titlebook: Noncontact Atomic Force Microscopy; S. Morita,R. Wiesendanger,E. Meyer Book 2002 Springer-Verlag Berlin Heidelberg 2002 AFM.Bias.Helium-At