FOLLY 发表于 2025-3-28 15:30:18

http://reply.papertrans.cn/67/6647/664688/664688_41.png

用树皮 发表于 2025-3-28 19:32:48

Resistivity Fluctuations in Highly Compensated NTD Silicon000 Ω-cm. Calculations are also presented of the maximum possible mean resistivity obtainable before fluctuation induced type conversion occurs as a function of the initial starting material resistivity fluctuation.

Meager 发表于 2025-3-29 00:56:18

Transistor Gain Trimming in I2L Integrated Circuits Using the NTD Processhow that a tenfold increase in substrate concentration increased inverse beta by a factor of approximately ten. Minority carrier diffusion length in the substrate was reduced from approximately 9 to 3 microns as a result of the irradiation. Overall results will be compared with I.L made on epitaxial substrates with comparable doping.

障碍物 发表于 2025-3-29 04:16:47

Determination of the Neutron Flux and Energy Spectrum and Calculation of Primary Recoil and Damage-E. The significance of this information with respect to the interpretations of various neutron radiation damage experiments is discussed. A general observation about neutron radiation damage in silicon is also suggested.

GROSS 发表于 2025-3-29 08:37:21

http://reply.papertrans.cn/67/6647/664688/664688_45.png

esoteric 发表于 2025-3-29 13:28:24

http://reply.papertrans.cn/67/6647/664688/664688_46.png

间谍活动 发表于 2025-3-29 18:01:32

http://reply.papertrans.cn/67/6647/664688/664688_47.png

指令 发表于 2025-3-29 21:11:08

http://reply.papertrans.cn/67/6647/664688/664688_48.png

Optimum 发表于 2025-3-30 00:14:04

http://reply.papertrans.cn/67/6647/664688/664688_49.png

行为 发表于 2025-3-30 07:41:48

http://reply.papertrans.cn/67/6647/664688/664688_50.png
页: 1 2 3 4 [5] 6 7
查看完整版本: Titlebook: Neutron Transmutation Doping in Semiconductors; Jon M. Meese Book 1979 Plenum Press, New York 1979 Potential.circuit.computer.energy.indus