Anthropoid
发表于 2025-3-26 22:09:52
Markus Morgenstern,Alexander Schwarz,Udo D. Schwarz
Extemporize
发表于 2025-3-27 01:38:57
Marina Ruths,Alan D. Berman,Jacob N. Israelachvili
Definitive
发表于 2025-3-27 05:48:31
Enrico Gnecco,Roland Bennewitz,Oliver Pfeiffer,Anisoara Socoliuc,Ernst Meyer
Cloudburst
发表于 2025-3-27 12:27:07
Andrzej J. Kulik,András Kis,Gérard Gremaud,Stefan Hengsberger,Philippe K. Zysset,Lásló Forró
情感脆弱
发表于 2025-3-27 15:04:42
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多余
发表于 2025-3-27 21:14:16
Probes in Scanning Microscopies correspond to the tip radius of curvature, the tip aspect ratio, and the sample height. Although silicon and silicon nitride tips have a somewhat large radius of curvature, low aspect ratio, and limited lifetime due to wear, the widespread use of AFM today is due in large part to the broad availabi
反省
发表于 2025-3-28 00:11:08
Low Temperature Scanning Probe Microscopyexcitations (scanning near-field microscopy) can be measured with high spatial resolution. In addition, some techniques even allow the manipulation of atomic configurations..Probably the most important advantage of the low-temperature operation of scanning probe techniques is that they lead to a sig
身体萌芽
发表于 2025-3-28 04:00:50
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FEAS
发表于 2025-3-28 07:16:06
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敬礼
发表于 2025-3-28 14:16:10
Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopytches. For a sliding interface requiring near-zero friction and wear, contact stresses should be below the hardness of the softer material to minimize plastic deformation, and surfaces should be free of nanoscratches. Wear precursors can be detected at early stages of wear by using surface potential