自由
发表于 2025-3-21 16:56:54
书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research影响因子(影响力)<br> http://impactfactor.cn/2024/if/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research影响因子(影响力)学科排名<br> http://impactfactor.cn/2024/ifr/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research网络公开度<br> http://impactfactor.cn/2024/at/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research网络公开度学科排名<br> http://impactfactor.cn/2024/atr/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research被引频次<br> http://impactfactor.cn/2024/tc/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research被引频次学科排名<br> http://impactfactor.cn/2024/tcr/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research年度引用<br> http://impactfactor.cn/2024/ii/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research年度引用学科排名<br> http://impactfactor.cn/2024/iir/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research读者反馈<br> http://impactfactor.cn/2024/5y/?ISSN=BK0660954<br><br> <br><br>书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research读者反馈学科排名<br> http://impactfactor.cn/2024/5yr/?ISSN=BK0660954<br><br> <br><br>
音乐会
发表于 2025-3-21 23:02:50
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产生
发表于 2025-3-22 02:37:46
Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Elndence of the Raman light of the vibration coupling coefficient .(.) and on the fact that each nanocrystalite of diameter . vibrates with its eigenfrequency . α 1/.. The effect of the particle vibrational lifetime on the shape of the distribution is analyzed and found to be negligible for free TiO.
irritation
发表于 2025-3-22 04:44:31
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avarice
发表于 2025-3-22 11:09:54
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寡头政治
发表于 2025-3-22 13:02:03
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ARCH
发表于 2025-3-22 20:53:17
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Blazon
发表于 2025-3-22 21:50:35
Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction,an alysis of silicon nanoregions are described. Details on the procedure employed to obtain the components of the strainten sor from anexp erimental CBED patternare given. The CBED methodology has been recently applied to the analysis of straininthe field of microelectronics; as anexample, the inves
Barter
发表于 2025-3-23 03:57:20
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FOVEA
发表于 2025-3-23 08:29:21
Long-Term Oxidation Behaviour of Lead Sulfide Surfaces,r one year); and ‘clean’ (cleaved in air and inserted into the vacuum system within about 10 minutes). The elements detected on the surfaces were Pb, S, O, Cl (a natural impurity) and C (adventitious or natural, carbonate). Images showed strong topographic contrast and weak chemical contrast for the