习惯
发表于 2025-3-21 16:40:06
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stress-response
发表于 2025-3-22 00:15:54
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forbid
发表于 2025-3-22 03:33:11
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CLEAR
发表于 2025-3-22 06:43:47
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Vertical
发表于 2025-3-22 12:21:14
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软弱
发表于 2025-3-22 15:33:22
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finite
发表于 2025-3-22 19:02:33
Jaehwan Kim,Curley Ohio,Prim Patanachaisiri,Renata Buzolin,Carla Jamille Arapiraca,Anshu Saxena Arorlm materials, their properties, constitution, structure and microstructure. Computer modelling and analytical techniques to characterise thin film structures are also included to give a comprehensive survey of materials for the IT industry... ..The Engineering Materials and Processes. series focuses
Clinch
发表于 2025-3-23 00:31:22
to the expected bulk value. Low EOT values around 0.75 nm have been obtained at very low leakage current of 4.5 × 10. A/cm. at 1 V in accumulation. The observed low frequency behaviour of the high frequency (. 1 kHz) C-V curves in inversion was attributed to the high intrinsic carrier concentration
Malfunction
发表于 2025-3-23 02:59:48
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Thyroiditis
发表于 2025-3-23 07:43:58
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