有法律效应
发表于 2025-3-23 12:10:49
R M Whiteside,A Wilson,S Blackburn,S E Hörnig,C P Wilsonr dimensions. This fluctuation in device geometries might prevent them from meeting timing and power criteria and degrade the parametric yield. Process limitations are not exhibited as physical disparities only; transistors experience temporal device degradation as well. On top of it, power manageme
Mortar
发表于 2025-3-23 15:50:36
R M Whiteside,A Wilson,S Blackburn,S E Hörnig,C P Wilsonent aggressive voltage scaling to reduce energy. Post-fabrication configuration, as we have in FPGAs, provides an opportunity to avoid the high costs of static margins. Rather than assuming worst-case device characteristics, we can deploy devices based on their fabricated or aged characteristics. Th
易弯曲
发表于 2025-3-23 19:03:37
R M Whiteside,A Wilson,S Blackburn,S E Hörnig,C P Wilsonent aggressive voltage scaling to reduce energy. Post-fabrication configuration, as we have in FPGAs, provides an opportunity to avoid the high costs of static margins. Rather than assuming worst-case device characteristics, we can deploy devices based on their fabricated or aged characteristics. Th
NAV
发表于 2025-3-23 22:50:45
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镶嵌细工
发表于 2025-3-24 05:25:33
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pulmonary
发表于 2025-3-24 07:16:23
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ARM
发表于 2025-3-24 14:34:05
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松鸡
发表于 2025-3-24 18:43:29
978-94-010-6847-5Graham & Trotman Limited 1990
Gentry
发表于 2025-3-24 19:43:42
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Scintillations
发表于 2025-3-24 23:51:25
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