dentin
发表于 2025-3-21 17:04:08
书目名称Machine Learning in VLSI Computer-Aided Design影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0620705<br><br> <br><br>书目名称Machine Learning in VLSI Computer-Aided Design读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0620705<br><br> <br><br>
粗鲁的人
发表于 2025-3-21 21:54:07
Ibrahim (Abe) M. Elfadel,Duane S. Boning,Xin LiProvides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability.Discusses the use of machine learn
Expediency
发表于 2025-3-22 02:20:30
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conscribe
发表于 2025-3-22 07:08:51
Springer Nature Switzerland AG 2019
做方舟
发表于 2025-3-22 11:46:16
A Preliminary Taxonomy for Machine Learning in VLSI CAD,ception. The purpose of this book is to bring to the interested reader a cross-section of the connections between existing and emerging machine learning methods and VLSI computer aided design (CAD). In this brief introduction, we begin with a high-level taxonomy of machine learning methods. We then
1FAWN
发表于 2025-3-22 16:41:08
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话
发表于 2025-3-22 17:33:58
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companion
发表于 2025-3-23 00:11:42
Machine Learning in Physical Verification, Mask Synthesis, and Physical Design as physical design, mask synthesis, and physical verification are critical to guarantee fast design closure and manufacturability. Recent advances in machine learning provide various new opportunities and approaches to tackle these challenges. This chapter will discuss several applications of machi
CHURL
发表于 2025-3-23 03:26:54
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Jingoism
发表于 2025-3-23 06:30:06
Machine Learning Approaches for IC Manufacturing Yield Enhancementinterest in machine learning and data mining techniques to improve yield to take advantage of this increasing volume of data. In this chapter, we introduce machine learning yield models for integrated circuit (IC) manufacturing yield enhancement. Challenges in this area include class imbalance due t