音乐学者
发表于 2025-3-23 11:25:42
http://reply.papertrans.cn/48/4752/475141/475141_11.png
遣返回国
发表于 2025-3-23 17:45:02
Bernd Schmidt,Klaus WetzigOffers comprehensive treatment of the use of ion beams in material science research.Includes numerous tables, graphs and illustrations that amplify the text.Provides optimization strategies for solid-
圣人
发表于 2025-3-23 18:21:42
http://reply.papertrans.cn/48/4752/475141/475141_13.png
Predigest
发表于 2025-3-24 01:44:30
978-3-7091-1733-0Springer-Verlag Wien 2013
女上瘾
发表于 2025-3-24 05:00:45
Materials Analysis by Ion Beams,scale from nm up to μm. Ion beam-based analytical techniques concern with ion sources, ion beams, the kind and cross section of ion interaction with matter, the emerging radiation (e.g., sputtered secondary ions, scattered ions, ion-induced photon, and electron emission), and appropriate radiation detection systems.
蔑视
发表于 2025-3-24 09:32:22
http://reply.papertrans.cn/48/4752/475141/475141_16.png
convert
发表于 2025-3-24 13:53:56
http://reply.papertrans.cn/48/4752/475141/475141_17.png
烦忧
发表于 2025-3-24 16:44:24
http://reply.papertrans.cn/48/4752/475141/475141_18.png
无脊椎
发表于 2025-3-24 20:03:05
,Ion–Solid Interactions,used by interactions between energetic ions and solids are not only the basis for understanding of ion beam materials processing but can also be exploited by a lot of micro- and nano-analytical techniques. Therefore, some important fundamentals of ion–solid interactions will be discussed in this chapter.
AVID
发表于 2025-3-24 23:59:48
Special Ion Beam Applications in Materials Analysis Problems,echnique for larger cut areas. Furthermore, ion beams can be used for the actual near-surface or cross-section analysis of thin solid films and layers. Here the typical method of choice is secondary ion mass spectrometry (SIMS), which is a depth-profiling method with typical detection limits down to the ppm range.