obesity
发表于 2025-3-21 17:29:18
书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0426818<br><br> <br><br>书目名称High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0426818<br><br> <br><br>
ANNUL
发表于 2025-3-21 20:26:29
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Arboreal
发表于 2025-3-22 01:34:44
2367-3478 o presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. .978-981-10-9321-0978-981-10-1073-6Series ISSN 2367-3478 Series E-ISSN 2367-3486
违法事实
发表于 2025-3-22 08:36:36
Architectural Reliability Exploration,he feature of unequal error protection based on information criticality. In Sect. . error confinement technique is proposed to correct errors in memory with statistical data, which reaches similar protection level with faster performance and less power consumption than traditional techniques.
壮观的游行
发表于 2025-3-22 09:22:10
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infarct
发表于 2025-3-22 13:33:01
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傲慢人
发表于 2025-3-22 18:32:30
Zheng Wang,Anupam ChattopadhyayOffers a systematic approach to high-level reliability estimation and exploration.Presents step-by-step procedures for 11 novel techniques and solutions.Includes more than 100 figures and illustration
增强
发表于 2025-3-23 01:18:23
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针叶
发表于 2025-3-23 04:19:52
Introduction,The last few decades have witnessed continuous scaling of CMOS technology, guided by Moore’s Law (G.E. Moore, 38(8), 114 ff, 1965. IEEE Solid-State Circuits Newsl., 3(20), 33–35, 2006), to support devices with higher speed, less area, and less power.
加剧
发表于 2025-3-23 08:15:51
Background,In this chapter, fundamental knowledge on reliability are discussed, including reliability definition, fault classification and fault models. In the next soft error and its evaluation metrics are elaborated, which is heavily used in the following chapters.