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发表于 2025-3-21 16:26:47
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斜
发表于 2025-3-22 00:00:23
Diffractometers and Reflectometerser band pass of energy, and various recording units to detect the x-rays. In this chapter we deal with the experimental arrangement as a whole. There are general aspects to consider in setting-up an x-ray experiment: The sample is illuminated by an incident beam striking the sample surface under a d
dry-eye
发表于 2025-3-22 03:28:02
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过度
发表于 2025-3-22 05:53:18
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Pamphlet
发表于 2025-3-22 10:49:17
Semikinematical Theoryere we have neglected multiple scattering, and dynamical theory, where the multiple scattering processes have been treated exactly. In most cases, the kinematical approach is sufficient for scattering in thin layers; however, it fails in some cases, especially in a surface-sensitive arrangement, whe
FACT
发表于 2025-3-22 13:13:48
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彩色
发表于 2025-3-22 19:59:07
Diffuse Scattering From Volume Defects in Thin Layers layers. We deal with so called weak defects (point defects and their clusters, small precipitates of another phase in the crystal lattice) as well as with strong defects (dislocations and their pile-ups). The description is based on the theory explained in the monograph . In contrast to this w
KEGEL
发表于 2025-3-22 21:38:43
X-Ray Scattering by Rough Multilayersillustrated by various examples. We describe the scattering potential of rough multilayers for x-ray reflection and later for x-ray diffraction; the multilayers are characterized by point properties and the correlation properties of their interfaces. General formulae are derived for the coherent par
perjury
发表于 2025-3-23 02:22:40
X-Ray Scattering by Artificially Lateral Semiconductor Nanostructuresperstructure with characteristic dimensions of a few nanometers up to a few microns. The scattering process includes the diffraction by the crystal lattice and by the superstructure. In reciprocal space the crystal lattice is represented by reciprocal lattice points. The superstructure of the gratin
抚慰
发表于 2025-3-23 07:42:25
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