减轻 发表于 2025-3-21 17:49:28

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avulsion 发表于 2025-3-21 21:56:30

SiO2 Based MOSFETS: Film Growth and Si—SiO2 Interface Properties

Decrepit 发表于 2025-3-22 03:14:15

Gate Dielectric Scaling to 2.0—1.0 nm: SiO2 and Silicon Oxynitride

手术刀 发表于 2025-3-22 05:14:55

Optimal Scaling Methodologies and Transistor Performance

Evocative 发表于 2025-3-22 12:18:32

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粘土 发表于 2025-3-22 13:01:52

Alternative Dielectrics for Silicon-Based Transistors: Selection Via Multiple Criteria

五行打油诗 发表于 2025-3-22 17:41:32

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Cardioversion 发表于 2025-3-22 22:04:36

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填料 发表于 2025-3-23 04:21:41

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Dealing 发表于 2025-3-23 06:18:36

Physicochemical Properties of Selected 4d, 5d, and Rare Earth Metals in Silicon
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查看完整版本: Titlebook: High Dielectric Constant Materials; VLSI MOSFET Applicat H.R. Huff,D.C. Gilmer Book 2005 Springer-Verlag Berlin Heidelberg 2005 CMOS.Leistu