MOTE
发表于 2025-3-21 16:46:21
书目名称Advances in Electronic Testing影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0385807<br><br> <br><br>书目名称Advances in Electronic Testing读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0385807<br><br> <br><br>
抚慰
发表于 2025-3-21 22:17:02
Failure Mechanisms and Testing in Nanometer Technologies,
reperfusion
发表于 2025-3-22 02:09:30
Book 2006-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex
indigenous
发表于 2025-3-22 08:03:13
978-1-4899-8773-0Springer-Verlag US 2006
GET
发表于 2025-3-22 10:26:52
Advances in Electronic Testing978-0-387-29409-4Series ISSN 0929-1296
Vertical
发表于 2025-3-22 14:41:53
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Vertical
发表于 2025-3-22 21:02:36
Dimitris GizopoulosFirst book that reviews a comprehensive set of advanced electronic testing topics.Hot" topics of current interest to test technology community has been selected.Authors are key contributors in the cor
姑姑在炫耀
发表于 2025-3-23 00:10:45
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Fallibility
发表于 2025-3-23 05:16:54
Book 2006d to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology,
GROWL
发表于 2025-3-23 06:13:53
Ernst von Glaserfeldte spaces in Kenya and compares it with other frameworks adopted by African countries and other selected countries globally. The paper further gives recommendations on the path to adoption and implementation of the dynamic spectrum management for national regulatory authorities in Africa.