Titlebook: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits; Michael L. Bushnell,Vishwani D. Agrawal Textbook 2002 - BOOKS with Alphabet E (Ea, Eb,Ec, Ed, Ee…... ) - 派博传思国际中心

Denial 发表于 2025-3-21 19:26:02

书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits影响因子(影响力) http://figure.impactfactor.cn/if/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits影响因子(影响力)学科排名 http://figure.impactfactor.cn/ifr/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits网络公开度 http://figure.impactfactor.cn/at/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits网络公开度学科排名 http://figure.impactfactor.cn/atr/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits被引频次 http://figure.impactfactor.cn/tc/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits被引频次学科排名 http://figure.impactfactor.cn/tcr/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits年度引用 http://figure.impactfactor.cn/ii/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits年度引用学科排名 http://figure.impactfactor.cn/iir/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits读者反馈 http://figure.impactfactor.cn/5y/?ISSN=BK0315632 书目名称Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits读者反馈学科排名 http://figure.impactfactor.cn/5yr/?ISSN=BK0315632

协定发表于 2025-3-21 20:43:48

Fault Modelingg. Chapters 5 through 8 develop algorithms based on these. In addition,one must gain working knowledge of models used in testing of memory (Chapter 9) and analog circuits (Chapters 10 and 11.) Fault models most likely to gain significance in the near future are the delay fault models discussed in Chapter 12.

婴儿发表于 2025-3-22 00:51:15

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遭遇发表于 2025-3-22 08:32:23

DSP-Based Analog and Mixed-Signal Testr most of the analog tests. It is important to understand that analog circuit testing is non-deterministic, and therefore the testing process is statistical and must also deal with electrical noise. As a proportion of total testing costs, the percentage due to analog testing is generally increasing.

民间传说 发表于 2025-3-22 12:48:07

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Senescent 发表于 2025-3-22 16:41:47

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Senescent 发表于 2025-3-22 20:50:44

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附录发表于 2025-3-22 21:23:35

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diabetes 发表于 2025-3-23 03:51:25

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

武器发表于 2025-3-23 08:49:41

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