二足动物
发表于 2025-3-21 16:22:23
书目名称Electrical Atomic Force Microscopy for Nanoelectronics影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0305698<br><br> <br><br>书目名称Electrical Atomic Force Microscopy for Nanoelectronics读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0305698<br><br> <br><br>
震惊
发表于 2025-3-21 21:45:08
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Discrete
发表于 2025-3-22 02:22:09
Eckart Richter,Thomas Feyerabendines and practical hands-on explanation for maximizing the image quality and data acquisition. Finally, a set of different application based in the use of piezo and ferroelectric materials is depicted, in which the AFM characterization took an important role as the primary characterization technique
AWL
发表于 2025-3-22 07:55:39
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somnambulism
发表于 2025-3-22 11:47:35
Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures, the recent years. These methods aid in extending conventional SSRM toward quantitative carrier profiling in aggressively scaled 3D device structures which is illustrated on the example of selected relevant applications such as FinFETs and nanowire-based transistors.
我正派
发表于 2025-3-22 13:41:12
Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique,ines and practical hands-on explanation for maximizing the image quality and data acquisition. Finally, a set of different application based in the use of piezo and ferroelectric materials is depicted, in which the AFM characterization took an important role as the primary characterization technique
我正派
发表于 2025-3-22 17:03:22
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paltry
发表于 2025-3-22 23:14:06
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舔食
发表于 2025-3-23 04:34:12
Electrical Atomic Force Microscopy for Nanoelectronics
CLAY
发表于 2025-3-23 08:37:42
Umberto CelanoComprehensive treatment of emerging devices, their operation and characterization.Authors provide a balance of industry and academic expertise.Includes images of state-of-the-art integrated devices.Co