欢乐东方 发表于 2025-3-23 13:12:52

Discussion on Classification Methods for Lifetime Evaluation of a Lab-Scale SiC MOSFET Power Moduleectronics devices introduces new issues concerning the reliability of equipment, especially in the transportation field. To meet these expectations, this paper discusses an approach to evaluate the percentage of lifetime of a lab-scale SiC MOSFET power module, designed for an aircraft application. T

基因组 发表于 2025-3-23 15:14:48

Dielectric Material Significance on Common Mode Transient Immunity of a Shielded Pulse Planar Transficiency attainments. However, this becomes opposing when utilized in planar pulse transformer-based gate driver applications, where rapid switching speeds originate electromagnetic disturbances due to the passage of common mode currents through the transformer’s stray capacitances. This paper will e

Instantaneous 发表于 2025-3-23 20:10:54

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countenance 发表于 2025-3-24 01:55:57

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DAMP 发表于 2025-3-24 06:02:30

PWM-Induced Current Modelling in Stator Slots with Multiple Stacked Coils a winding into several coils. These latter are supplied independently by H-bridge converters and are wound around the same magnetic circuit. This process leads to a deeper segmentation of electric drives for enhanced modularity and reduced voltage rating. The strong magnetic coupling between each c

Fabric 发表于 2025-3-24 08:49:03

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ENDOW 发表于 2025-3-24 14:04:35

d using a low complexity process to offer compromise between computation time and results accuracy. This constitutes a very effective support tools to help design engineers in the early design stages.

Encumber 发表于 2025-3-24 17:07:00

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CRACK 发表于 2025-3-24 19:41:40

Ist die freie Welt zum Untergang verurteilt?ctrical circuit calibrated through experimental results. A trade-off is found between the losses related either to the distribution of the fundamental component of currents or to the switching power converter supply.

生存环境 发表于 2025-3-25 00:40:11

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查看完整版本: Titlebook: ELECTRIMACS 2022; Selected Papers – Vo Serge Pierfederici,Jean-Philippe Martin Conference proceedings 2023 The Editor(s) (if applicable) an