myriad
发表于 2025-3-23 12:15:04
978-94-007-9798-7Springer Science+Business Media Dordrecht 2013
整洁
发表于 2025-3-23 16:06:09
Superposition with Structural Induction other defects. Over time, IC technology scaling has heightened device sensitivity to a different kind of error, known as a soft, or transient errors. Soft errors are caused by external noise or radiation that temporarily affects circuit behavior without permanently damaging the hardware. With the a
dearth
发表于 2025-3-23 19:57:02
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折磨
发表于 2025-3-24 01:15:39
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喃喃诉苦
发表于 2025-3-24 03:32:23
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时间等
发表于 2025-3-24 10:30:35
Lecture Notes in Computer Scienceacy. To address this challenge, we present AnSER, our linear-time method for logic-level soft-error analysis. AnSER achieves its low runtimes by means of functional simulation signatures, which enable a fast and accurate method for computing signal probability and observability, even in the presence
thwart
发表于 2025-3-24 11:33:59
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MIRTH
发表于 2025-3-24 15:19:26
Smita Krishnaswamy,Igor L. Markov,John P. HayesPresents a comprehensive overview of Logic Circuits.Combines theory with practical examples.Multi-discipline approach to the "hot" topic of uncertainty.Includes supplementary material:
Oration
发表于 2025-3-24 23:05:19
Lecture Notes in Electrical Engineeringhttp://image.papertrans.cn/d/image/268801.jpg
凹处
发表于 2025-3-25 00:30:46
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