novelty
发表于 2025-3-28 14:56:16
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弯曲道理
发表于 2025-3-28 20:57:40
Test Application Schemes for Testing Delay Defects,tors be applied to the circuit at its intended operating speed. However, since high speed testers require huge investments, testers currently used in test facilities could be slower than the new designs that need to be tested on them. Testing high speed designs on slower testers requires special test application and test generation strategies.
消散
发表于 2025-3-29 00:55:38
Design for Delay Fault Testability,umber of faults that can be guaranteed to be detected independent of delays outside the target path, etc. This chapter describes design for testability techniques such as test point insertion and use of partial scan as well as techniques for resynthesizing the circuit such that its path delay fault testability is improved.
creditor
发表于 2025-3-29 03:08:01
Rhinomanometrische Untersuchungene used for representing delay defects lumped at gates while the path and segment delay models address defects that are distributed over several gates. The advantages and disadvantages of each model are discussed.