独裁者
发表于 2025-3-21 17:04:01
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蛰伏
发表于 2025-3-21 23:21:47
ware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;.Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to 978-3-319-35610-5978-3-319-09309-3
abysmal
发表于 2025-3-22 03:34:13
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繁荣地区
发表于 2025-3-22 07:52:25
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embolus
发表于 2025-3-22 11:41:06
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牵索
发表于 2025-3-22 15:38:32
Summary and Outlook to time-to-market constraints, 100 % verification coverage at the design level is an elusive task. Consequently, automated debugging approaches are required at both pre-silicon and post-silicon stages in order to reduce the development time of IC products.
牵索
发表于 2025-3-22 20:56:34
https://doi.org/10.1007/978-3-531-91774-0rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct desi
可能性
发表于 2025-3-22 21:19:06
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Femine
发表于 2025-3-23 03:02:05
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Multiple
发表于 2025-3-23 08:48:44
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