Decongestant
发表于 2025-3-28 18:09:01
Advanced Technologies and Societal Changes are useful for product yield optimization through silicon process tuning and variability reduction. Appropriately designed embedded process monitors can help bridge both upward in the hierarchy to complex circuitry and downward to the properties of the constituent components and to the silicon man
词汇
发表于 2025-3-28 20:12:37
Christian Ngô,Marcel H. Van de Voordetrical tests are defined to cover the range of operating conditions such as power supply voltage and temperature over which any chip may need to function. The data collected are analyzed to isolate factors influencing chip yield and performance. Understanding the various sources of variations and th
chemical-peel
发表于 2025-3-29 00:17:34
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Allergic
发表于 2025-3-29 06:11:25
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Digitalis
发表于 2025-3-29 09:22:47
Christian Ngo,Marcel H. Van de Voordeegree of automation to post-processing of data for rapid feedback and debug. However, domain expertize is a valuable asset and in many cases an essential ingredient for finding the root cause. A brief overview of statistical methods including probability, distributions, correlation, and regression a
抑制
发表于 2025-3-29 15:17:57
Christian Ngô,Marcel H. Van de Voordeent technology nodes, or between similar technologies on different substrates, such as bulk silicon and SOI. Such comparisons are used in guiding technology development, in benchmarking and selecting the most suitable CMOS manufacturing process or foundry for a given product, and in projecting CMOS
直言不讳
发表于 2025-3-29 16:55:39
https://doi.org/10.1007/978-1-4939-1349-7CMOS manufacturing test and quality control; CMOS microelectronic test structures; CMOS products; CMOS