SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子<br> http://impactfactor.cn/2024/if/?ISSN=0026-2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)影响因子@(工程,电气和电子)学科排名<br> http://impactfactor.cn/2024/ifr/?ISSN=0026C2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)总引论文<br> http://impactfactor.cn/2024/at/?ISSN=0026-2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引论文@(工程,电气和电子)学科排名<br> http://impactfactor.cn/2024/atr/?ISSN=0026C2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子<br> http://impactfactor.cn/2024/tc/?ISSN=0026-2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引频次@(工程,电气和电子)学科排名<br> http://impactfactor.cn/2024/tcr/?ISSN=0026C2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)即时影响因子<br> http://impactfactor.cn/2024/ii/?ISSN=0026-2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)即时影响因子@(工程,电气和电子)学科排名<br> http://impactfactor.cn/2024/iir/?ISSN=0026C2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)五年累积影响因子<br> http://impactfactor.cn/2024/5y/?ISSN=0026-2714<br><br> SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)五年累积影响因子@(工程,电气和电子)学科排名<br> http://impactfactor.cn/2024/5yr/?ISSN=0026C2714<br><br>
Submitted on: 11 September 2017.
Revised on: 22 October 2017.
Accepted on: 18 November 2017.
MICROELECTRONICS RELIABILITY
Submitted on: 24 March 1999.
Revised on: 16 April 1999.
Accepted on: 24 April 1999.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
Submitted on: 25 July 2010.
Revised on: 27 August 2010.
Accepted on: 07 September 2010.
MICROELECTRONICS RELIABILITY
Submitted on: 07 August 2005.
Revised on: 09 September 2005.
Accepted on: 03 October 2005.
MICROELECTRONICS RELIABILITY
Submitted on: 11 March 2006.
Revised on: 23 April 2006.
Accepted on: 11 May 2006.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
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Submitted on: 18 September 2016.
Revised on: 21 October 2016.
Accepted on: 29 October 2016.
MICROELECTRONICS RELIABILITY
Submitted on: 27 August 1999.
Revised on: 09 October 1999.
Accepted on: 03 November 1999.
MICROELECTRONICS RELIABILITY