愚蠢地活 发表于 2025-3-21 17:11:09

        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子<br>        http://impactfactor.cn/2024/if/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)影响因子@(应用物理学)学科排名<br>        http://impactfactor.cn/2024/ifr/?ISSN=0026B2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)总引论文<br>        http://impactfactor.cn/2024/at/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引论文@(应用物理学)学科排名<br>        http://impactfactor.cn/2024/atr/?ISSN=0026B2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子<br>        http://impactfactor.cn/2024/tc/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引频次@(应用物理学)学科排名<br>        http://impactfactor.cn/2024/tcr/?ISSN=0026B2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)即时影响因子<br>        http://impactfactor.cn/2024/ii/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)即时影响因子@(应用物理学)学科排名<br>        http://impactfactor.cn/2024/iir/?ISSN=0026B2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)五年累积影响因子<br>        http://impactfactor.cn/2024/5y/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)五年累积影响因子@(应用物理学)学科排名<br>        http://impactfactor.cn/2024/5yr/?ISSN=0026B2714<br><br>       

Genetics 发表于 2025-3-21 22:48:20

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Expostulate 发表于 2025-3-22 03:59:44

Submitted on: 29 November 2000.
Revised on: 13 December 2000.
Accepted on: 25 December 2000.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD

鉴赏家 发表于 2025-3-22 05:59:22

Submitted on: 04 June 2017.
Revised on: 10 July 2017.
Accepted on: 29 July 2017.
MICROELECTRONICS RELIABILITY

jabber 发表于 2025-3-22 09:08:46

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赔偿 发表于 2025-3-22 16:15:06

Submitted on: 22 July 2017.
Revised on: 07 August 2017.
Accepted on: 12 August 2017.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD

Ige326 发表于 2025-3-22 18:08:11

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Nomogram 发表于 2025-3-22 21:26:40

Submitted on: 24 July 2020.
Revised on: 11 August 2020.
Accepted on: 29 August 2020.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD

SLING 发表于 2025-3-23 04:35:41

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昏睡中 发表于 2025-3-23 07:14:11

Submitted on: 21 October 2015.
Revised on: 02 November 2015.
Accepted on: 08 November 2015.
MICROELECTRONICS RELIABILITY
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