Falter 发表于 2025-3-21 19:08:15

        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子<br>        http://impactfactor.cn/2024/if/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)影响因子@(纳米科学与纳米技术)学科排名<br>        http://impactfactor.cn/2024/ifr/?ISSN=0026A2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)总引论文<br>        http://impactfactor.cn/2024/at/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引论文@(纳米科学与纳米技术)学科排名<br>        http://impactfactor.cn/2024/atr/?ISSN=0026A2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子<br>        http://impactfactor.cn/2024/tc/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引频次@(纳米科学与纳米技术)学科排名<br>        http://impactfactor.cn/2024/tcr/?ISSN=0026A2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)即时影响因子<br>        http://impactfactor.cn/2024/ii/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)即时影响因子@(纳米科学与纳米技术)学科排名<br>        http://impactfactor.cn/2024/iir/?ISSN=0026A2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)五年累积影响因子<br>        http://impactfactor.cn/2024/5y/?ISSN=0026-2714<br><br>        SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)五年累积影响因子@(纳米科学与纳米技术)学科排名<br>        http://impactfactor.cn/2024/5yr/?ISSN=0026A2714<br><br>       

Thyroid-Gland 发表于 2025-3-21 23:57:51

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exceptional 发表于 2025-3-22 01:10:20

Submitted on: 17 January 2010.
Revised on: 25 February 2010.
Accepted on: 03 March 2010.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD

Opponent 发表于 2025-3-22 07:51:37

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细节 发表于 2025-3-22 11:53:40

Submitted on: 28 April 2020.
Revised on: 20 May 2020.
Accepted on: 03 June 2020.
MICROELECTRONICS RELIABILITY

carotenoids 发表于 2025-3-22 15:25:00

Submitted on: 20 February 2017.
Revised on: 14 March 2017.
Accepted on: 22 March 2017.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD

嫌恶 发表于 2025-3-22 18:32:12

Submitted on: 19 September 2000.
Revised on: 17 October 2000.
Accepted on: 12 November 2000.
MICROELECTRONICS RELIABILITY

Tailor 发表于 2025-3-22 22:10:17

Submitted on: 04 June 2015.
Revised on: 03 July 2015.
Accepted on: 29 July 2015.
MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD

thrombus 发表于 2025-3-23 04:06:29

Submitted on: 04 January 2001.
Revised on: 31 January 2001.
Accepted on: 09 February 2001.
MICROELECTRONICS RELIABILITY

dyspareunia 发表于 2025-3-23 06:35:55

Submitted on: 08 October 2018.
Revised on: 08 November 2018.
Accepted on: 29 November 2018.
MICROELECTRONICS RELIABILITY
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