Adentitious
发表于 2025-3-21 16:15:24
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唠叨
发表于 2025-3-21 23:37:58
https://doi.org/10.1007/1-4020-4078-4be microscopy, 2nd edn. Elsevier, Amsterdam, 2018, [.]; Golek, Mazur, Ryszka, Zuber, Appl Surf Sci 304, 11–19, 2014, [.]; Eaton, Batziou, Atomic force microscopy, vol. 1886. Humana Press, New York, 2019, [.]) include thermal drift, feedback overshoot, piezo creep, and electrical noise.
协定
发表于 2025-3-22 02:04:57
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extinct
发表于 2025-3-22 08:19:37
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Mast-Cell
发表于 2025-3-22 11:42:33
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facetious
发表于 2025-3-22 15:49:58
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弄脏
发表于 2025-3-22 19:33:12
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pulse-pressure
发表于 2025-3-22 23:50:03
https://doi.org/10.1007/978-981-10-3120-5ing we do not consider noise due to floor vibrations or sound, but more fundamental limits of noise due to thermal excitation of the cantilever, or due to the detection limit of the preamplifier detecting the signal.
消音器
发表于 2025-3-23 05:03:13
Electronics and Control for Atomic Force Microscopy,dback electronics, which in AFM serves to stabilize the tip-sample distance. We close this chapter on electronics by discussing how digital-to-analog converters and analog-to-digital converters work in principle.
Isometric
发表于 2025-3-23 08:14:43
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