豪华 发表于 2025-3-28 18:21:59
Applied Scanning Probe Methods VIII978-3-540-74080-3Series ISSN 1434-4904 Series E-ISSN 2197-7127持久 发表于 2025-3-28 21:43:35
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978-3-642-09340-1Springer-Verlag Berlin Heidelberg 2008HEDGE 发表于 2025-3-29 03:15:45
Book 2008includingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport propFEAS 发表于 2025-3-29 09:57:45
Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes,) multiple cross-sectional, with resolution comparable to that of transmission electron microscopy (TEM). Recently, these attributes have enhanced the role of CD AFM as the RMS for other metrology systems.内阁 发表于 2025-3-29 13:25:00
Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging,ntrol parameters such as radius, length, angle with the sample and anchoring are discussed. The mechanical properties of those nanotubes anchored to the tip aremodeled and experimentally probed by dynamical atomic force microscopy in frequency modulation mode. Most of the nanotube mechanical behavio变形词 发表于 2025-3-29 19:08:09
http://reply.papertrans.cn/17/1602/160123/160123_47.pnginsidious 发表于 2025-3-29 22:26:58
http://reply.papertrans.cn/17/1602/160123/160123_48.png使迷醉 发表于 2025-3-30 02:25:32
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