Titlebook: A Unified Approach for Timing Verification and Delay Fault Testing; Mukund Sivaraman,Andrzej J. Strojwas Book 1998 Springer Science+Busine - BOOKS with Alphabet A (Aa, Ab,Ac, Ad, Ae…... ) - 派博传思国际中心

偏差发表于 2025-3-21 17:03:06

书目名称A Unified Approach for Timing Verification and Delay Fault Testing影响因子(影响力) http://figure.impactfactor.cn/if/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing影响因子(影响力)学科排名 http://figure.impactfactor.cn/ifr/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing网络公开度 http://figure.impactfactor.cn/at/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing网络公开度学科排名 http://figure.impactfactor.cn/atr/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing被引频次 http://figure.impactfactor.cn/tc/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing被引频次学科排名 http://figure.impactfactor.cn/tcr/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing年度引用 http://figure.impactfactor.cn/ii/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing年度引用学科排名 http://figure.impactfactor.cn/iir/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing读者反馈 http://figure.impactfactor.cn/5y/?ISSN=BK0142545 书目名称A Unified Approach for Timing Verification and Delay Fault Testing读者反馈学科排名 http://figure.impactfactor.cn/5yr/?ISSN=BK0142545

诱惑发表于 2025-3-21 22:21:31

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intrigue 发表于 2025-3-22 03:55:33

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HEPA-filter 发表于 2025-3-22 07:31:03

Hans Ramløv,Dennis Steven Friisput stabilizes to its final logic value. In other words, the maximum of the primitive PDF delays is a valid bound for the maximum circuit delay. We elaborate on this in Section 4.1, and prove that this in fact is exactly equal to the maximum circuit delay under the floating mode of operation. We the

不舒服 发表于 2025-3-22 08:49:39

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FLIT 发表于 2025-3-22 14:24:50

https://doi.org/10.1007/978-1-4614-3840-3elay testing, it is therefore judicious to select a manageable set of test patterns which test each fabricated chip for the presence of delay faults. If a fabricated chip passes a set of delay tests, the confidence one has in the absence of delay faults in the chip is a measure of the effectiveness

Ccu106 发表于 2025-3-22 17:05:05

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有斑点 发表于 2025-3-22 22:19:27

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tenosynovitis 发表于 2025-3-23 02:16:19

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