使委屈
发表于 2025-3-21 16:16:28
书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0980130<br><br> <br><br>书目名称VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0980130<br><br> <br><br>
jaundiced
发表于 2025-3-21 23:32:25
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BLA
发表于 2025-3-22 00:38:33
1868-4238 gy and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design..978-3-319-88379-3978-3-319-67104-8Series ISSN 1868-4238 Series E-ISSN 1868-422X
GOAD
发表于 2025-3-22 06:17:08
Enabling Internet-of-Things with Opportunities Brought by Emerging Devices, Circuits and Architectu has become the key concern, which relies on innovations from all levels of device, circuits, and architectures. Meanwhile, the energy efficiency of existing IoT implementations based on the CMOS technology is fundamentally limited by the device physics and also the circuits and systems built on it.
GENUS
发表于 2025-3-22 09:04:58
,Logic with Unipolar Memristors – Circuits and Design Methodology,ance, which is controlled by the voltage or current applied to them. The resistance state of a memristor is nonvolatile, and as such makes memristors attractive candidates for use as novel memory elements. Apart from their use for memory applications, the use of memristors in logic circuits is widel
FLAGR
发表于 2025-3-22 14:31:38
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squander
发表于 2025-3-22 18:00:56
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FLAG
发表于 2025-3-23 00:12:58
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BLOT
发表于 2025-3-23 03:21:15
Improving the Efficiency of Formal Verification: The Case of Clock-Domain Crossings,lish the functional correctness of all clock-domain crossings (CDCs) in a system-on-chip (SoC), semi-automatic approaches require non-trivial manual deductive reasoning. In contrast, our approach produces a small sequence of easy queries to the user. The key idea is to use counterexample-guided abst
真实的你
发表于 2025-3-23 09:16:02
Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs,vices that may result in early life failures. Devices used in safety critical environments must undergo this phase that is usually accomplished by exploiting the Burn-In (BI) process. Unfortunately, BI has elevated costs for companies and current state of the art techniques are trying to reduce its