小故障
发表于 2025-3-21 17:49:33
书目名称VLSI-SoC: New Technology Enabler影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0980127<br><br> <br><br>书目名称VLSI-SoC: New Technology Enabler读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0980127<br><br> <br><br>
HPA533
发表于 2025-3-21 20:41:13
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stratum-corneum
发表于 2025-3-22 03:46:58
1868-4238 y Large Scale Integration, VLSI-SoC 2019, held in Cusco, Peru, in October 2019...The 15 full papers included in this volume were carefully reviewed and selected from the 28 papers (out of 82 submissions) presented at the conference. The papers discuss the latest academic and industrial results and d
Monolithic
发表于 2025-3-22 07:05:23
Software-Based Self-Test for Delay Faults,utomatically generated test patterns. However, functional approaches are often used to complement test suites. Software-Based Self-Test (SBST) can be used to increase defect coverage in microcontrollers, to replace part of the scan pattern set to reduce tester requirements, or to complement the defe
acrimony
发表于 2025-3-22 10:03:23
On Test Generation for Microprocessors for Extended Class of Functional Faults,arge class of high-level functional faults. This is comparable to that used in memory testing which also covers a large class of structural faults such as stuck-at-faults (SAF), conditional SAF, multiple SAF and bridging faults. The approach is fully high-level, the model of the microprocessor is de
愤慨一下
发表于 2025-3-22 13:34:27
Robust FinFET Schmitt Trigger Designs for Low Power Applications,ability impact. Given the broad set of IoT devices running on battery-oriented environments, energy consumption should be minimal and the operation reliable. Schmitt Trigger inverters are frequently used for noise immunity enhancement, and have been recently applied to mitigate radiation effects and
易弯曲
发表于 2025-3-22 19:44:21
An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults,ificant performance and area penalties, especially when a design with fault-tolerant structure is overprotected. There are several estimation methods, as Probabilistic Transfer Matrix, Signal Probability Reliability, and SPR Multi-Pass, to evaluate circuit reliability. Theses methods use probabilist
Assemble
发表于 2025-3-22 22:20:09
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西瓜
发表于 2025-3-23 04:16:37
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依法逮捕
发表于 2025-3-23 06:02:47
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