愚蠢地活 发表于 2025-3-21 17:57:17

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IDEAS 发表于 2025-3-21 23:22:20

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engrave 发表于 2025-3-22 01:29:27

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oracle 发表于 2025-3-22 05:55:12

Impact of Fin Width and Graded Channel Doping on the Performance of 22nm SOI FinFET,fin width to be scaled beyond 10nm. Stability of the fins patterned beyond 10nm width is to be viewed with suspected eyes. It is observed that Graded doping of the channel will improve threshold voltage and hence the ratio of I. to ..will also increase, which is desired for enhanced performance in analog applications.

单色 发表于 2025-3-22 08:47:04

1865-0929 ubmissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.978-3-642-42023-8978-3-642-42024-5Series ISSN 1865-0929 Series E-ISSN 1865-0937

叙述 发表于 2025-3-22 13:56:08

A Novel Design Methodology for High Tuning Linearity and Wide Tuning Range Ring Voltage Controlled uration region during switching and consequently enhances the tuning range without additional circuitry. The design is implemented in UMC 0.18 .m CMOS technology at 1.8 V supply voltage. The overall circuit consumes 260 .W power at 404.5 MHz, has a wide tuning range of 66 MHz to 875 MHz having 94.5% tuning linearity.

Morbid 发表于 2025-3-22 19:00:00

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FACT 发表于 2025-3-22 23:31:43

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Mercantile 发表于 2025-3-23 03:23:02

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名词 发表于 2025-3-23 09:12:05

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查看完整版本: Titlebook: VLSI Design and Test; 17th International S Manoj Singh Gaur,Mark Zwolinski,Adit D. Sing Conference proceedings 2013 Springer-Verlag Berlin