morphology 发表于 2025-3-21 17:43:06

书目名称Testing and Reliable Design of CMOS Circuits影响因子(影响力)<br>        http://impactfactor.cn/if/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits影响因子(影响力)学科排名<br>        http://impactfactor.cn/ifr/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits网络公开度<br>        http://impactfactor.cn/at/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits网络公开度学科排名<br>        http://impactfactor.cn/atr/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits被引频次<br>        http://impactfactor.cn/tc/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits被引频次学科排名<br>        http://impactfactor.cn/tcr/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits年度引用<br>        http://impactfactor.cn/ii/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits年度引用学科排名<br>        http://impactfactor.cn/iir/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits读者反馈<br>        http://impactfactor.cn/5y/?ISSN=BK0903413<br><br>        <br><br>书目名称Testing and Reliable Design of CMOS Circuits读者反馈学科排名<br>        http://impactfactor.cn/5yr/?ISSN=BK0903413<br><br>        <br><br>

半圆凿 发表于 2025-3-21 20:27:17

第103413主题贴--第2楼 (沙发)

CLASP 发表于 2025-3-22 01:08:26

板凳

矛盾心理 发表于 2025-3-22 06:57:25

第4楼

AFFIX 发表于 2025-3-22 12:18:29

5楼

AWE 发表于 2025-3-22 14:48:54

6楼

喃喃诉苦 发表于 2025-3-22 19:41:42

7楼

Mnemonics 发表于 2025-3-22 22:06:59

8楼

notion 发表于 2025-3-23 04:27:59

9楼

镀金 发表于 2025-3-23 09:22:28

10楼
页: [1] 2 3 4
查看完整版本: Titlebook: Testing and Reliable Design of CMOS Circuits; Niraj K. Jha,Sandip Kundu Book 1990 Kluwer Academic Publishers 1990 CMOS.VLSI.algorithms.cir