草本植物
发表于 2025-3-30 10:26:28
Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectrosct is considered here because this electron spectroscopy is based on a mechanism similar to that of XPS, it can be developed in parallel with AES and it allows also the surface elemental identification with an information depth in the nanometer range.
逃避责任
发表于 2025-3-30 13:21:33
Emission and Low Energy Reflection Electron Microscopy,res or thickness differences: plane-view TEM). Imaging with slow electrons, on the other hand, relies either on the low escape depth of slow electrons and/or on their transmission probability through the surface.