废止
发表于 2025-3-26 23:37:34
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使显得不重要
发表于 2025-3-27 04:07:30
SIMS — Secondary Ion Mass Spectrometryom the target atoms by the impact are extracted from the surface by an electric field and then energy and mass analyzed. The ions are then detected by a Faraday cup or electron multiplier and the resulting secondary ion distribution displayed as a function of mass, surface location or depth into the sample (Fig. 5.1).
Schlemms-Canal
发表于 2025-3-27 07:39:17
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Suggestions
发表于 2025-3-27 09:47:57
Low Energy Electron Diffractionls and ultrahigh vacuum conditions it has limited value for applied surface analysis, which is often concerned with polycrystalline or amorphous materials. LEED has many similarities to X-ray and neutron diffraction but it is preferred for surface studies because of the short mean free path of low energy electrons in solids.
食草
发表于 2025-3-27 17:29:38
Solid Surfaces, Their Structure and Composition been able to establish an improved understanding of their properties. In everyday life our perceptions of solid materials, and in particular their surfaces, are strongly distorted by the limitations of visible light. These wavelengths are a thousand times larger than dimensions of the surface regio
熟练
发表于 2025-3-27 21:02:01
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Evocative
发表于 2025-3-28 00:22:16
Electron Microscope Techniques for Surface Characterizationical techniques are more recent additions to the materials scientists’ range of experimental methods for learning about materials properties. Microscopy and spectroscopy are complementary, and the use of one alone can result in an inadequate characterization of a material. In this chapter we will co
ungainly
发表于 2025-3-28 02:46:16
Sputter Depth Profilingents in both the surface plane and as a function of depth normal to the surface. This chapter will concentrate on ways of analyzing depth distributions of elements, up to a few microns deep, using ion beam sputter profiling. Sputter profiling uses the combination of a surface sensitive analytical te
ARK
发表于 2025-3-28 08:44:04
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Acetaldehyde
发表于 2025-3-28 14:02:46
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