情感 发表于 2025-3-25 06:58:04
Cross-Sectional Scanning Tunneling Microscopy as a Probe of Local Order in Semiconductor Alloys,order parameter, that enables direct comparison of the cross-sectional STM data with optical or x-ray measurements. The spatial evolution of the order parameter near the alloy/buffer interface is studied in the case of GaInP on GaAs, where the STM images reveal antiphase boundaries that presumably pAggrandize 发表于 2025-3-25 08:18:44
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Book 2002ess has been made toward understanding the mechanisms that drive this phenomenon and the changes in physical properties that result from it. A variety of experimental techniques have been used to probe the phenomenon and several attempts made atproviding theoretical models both for the ordering mechfamine 发表于 2025-3-25 18:16:25
cant progress has been made toward understanding the mechanisms that drive this phenomenon and the changes in physical properties that result from it. A variety of experimental techniques have been used to probe the phenomenon and several attempts made atproviding theoretical models both for the ordering mech978-1-4613-5167-2978-1-4615-0631-7喊叫 发表于 2025-3-25 22:16:33
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,Basic Aspects of Atomic Ordering in III–V Semiconductor Alloys,nfluence of surface reconstructions and atomic steps at growing surfaces during vapor-phase epitaxy; this mechanism is completely different from the conventional atomic ordering in metal alloys. The implications of these studies of atomic ordering are also discussed.iodides 发表于 2025-3-26 06:08:53
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,X-Ray Characterization of CuPt Ordered III–V Ternary Alloys,mic displacements due to the bond length difference between the two constitutive binary materials. The model enables us to extract quantitatively the structural information of the ordered films from the x-ray diffraction data.