大火
发表于 2025-3-23 10:58:55
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使成整体
发表于 2025-3-23 15:27:41
Book 2016nt (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Techniq
encomiast
发表于 2025-3-23 18:58:45
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同谋
发表于 2025-3-24 00:25:04
Single Event Upset Hardening of Interconnects,ed in the SE Hardening of CMOS logic gates due to technology scaling effects that increase both SE vulnerability and crosstalk effects. This chapter studies hardening techniques to reduce SE crosstalk and delay effects.
medium
发表于 2025-3-24 03:20:16
Transmission Gate (TG) Based Soft Error Mitigation Methods,can be individually controlled and the task of SET suppression is divided between the proposed TG method and the driver sizing. In comparison to driver sizing taken alone, the combine approach saves considerable circuit area while keeping the timing constraints.
集聚成团
发表于 2025-3-24 08:46:15
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隐语
发表于 2025-3-24 11:26:49
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dainty
发表于 2025-3-24 17:13:14
noise, delay and speed-up effects and then compares couplingThis book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening te
PHIL
发表于 2025-3-24 19:08:37
Mitigation of Single Event Effects,address single-event effects as terrestrial radiation sources become a significant source of soft errors in ground-based applications. This chapter gives an overview of various soft error mitigation techniques. Some of the techniques discussed include spatial and time redundancy techniques, driver s
MODE
发表于 2025-3-24 23:56:03
Transmission Gate (TG) Based Soft Error Mitigation Methods, TG design and Transient Tunable Filter methodologies, it focuses on a TG mitigation methodology based on “varying gate and body bias control”. In this technique, the gate voltages as well as body biases of individual pass transistors on the TG can be adjusted to allow filtering of varying transient