拥护
发表于 2025-3-25 06:49:06
Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devicesn of individual nanotube devices. At the same time, both experimental and theoretical investigations found that many of the phenomena observed in transport studies of these devices are not due to bulk properties of nanotubes, but depend instead on local atomic-scale details including defects and imp
Cabg318
发表于 2025-3-25 08:31:20
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乐意
发表于 2025-3-25 15:00:51
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Spartan
发表于 2025-3-25 17:04:21
Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopye in the channel length was responsible for a more than 10% increase in the gate-to-drain overlap capacitance [.]. In the 65-nm devices processed today, effects of shifts in lateral position of a few nanometers or of variations in concentration of a few percent in the channel are drastically more pronounced.
LUMEN
发表于 2025-3-25 23:46:11
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cancer
发表于 2025-3-26 02:25:52
Near-Field High-Frequency Probingerties of metals, insulators, and dielectrics are briefly reviewed since these provide the basis for image contrast. Finally, a wide range of near-field probes are described, including optical, infrared, microwave, etc. The literature on high-frequency near-field probes is surveyed throughout the text.
microscopic
发表于 2025-3-26 05:44:42
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称赞
发表于 2025-3-26 12:25:39
l aspects of materials characterization as applied to semico.Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced
同步左右
发表于 2025-3-26 15:50:41
Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transportsimilar to the macroscopic four-probe method commonly adopted for measuring electrical transport, with the inner two probes replaced by a scanning tunneling tip. This chapter describes principles, reviews approaches, and illustrates capabilities of STP.
Optimum
发表于 2025-3-26 19:17:28
Electrochemical SPMd local electrochemical impedance spectroscopy-atomic force microscopy (LEISAFM). Applications of these modern EC-SPM techniques in emerging areas of energy storage and conversion, corrosion, catalysis, and electrochemical deposition processes are underscored to emphasize the resolving power of these methods.