ALT
发表于 2025-3-26 21:09:55
Scanning Electron Microscopy978-3-540-38967-5Series ISSN 0342-4111 Series E-ISSN 1556-1534
Canary
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Springer Series in Optical Scienceshttp://image.papertrans.cn/s/image/861148.jpg
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Book 1998Latest editionimaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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发表于 2025-3-27 19:45:30
Elemental Analysis and Imaging with X-Rays,The deceleration of fast electrons in the Coulomb field of a nucleus can result in the emission of a background x-ray quantum. The de-excitation of an inner-shell ionization results either in the emission of a characteristic x-ray quantum or in the emission of an Auger electron, both of which can be used for elemental analysis.
连锁
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Crystal Structure Analysis by Diffraction,graphic emulsion or via a TV camera. At oblique incidence of the electron beam, the reflection high-energy electron diffraction (RHEED) pattern may contain Bragg diffraction spots and Kikuchi lines. ECP and EBSP are related by the theorem of reciprocity. These patterns contain information about the