SKIFF
发表于 2025-3-30 12:11:01
Alla E. Tschirikowandwidth of the fiber, limiting the throughput of the network. Different solutions at both the system and the circuit levels have been proposed to increase the data rate of the backbone. System-level solutions are based on the utilization of wave-division multiplexing (WDM), using different colors of
宴会
发表于 2025-3-30 13:28:59
Petra Stykowndwidth of the fiber, limiting the throughput of the network. Different solutions at both the system and the circuit levels have been proposed to increase the data rate of the backbone. System-level solutions are based on the utilization of wave-division multiplexing (WDM), using different colors of
雕镂
发表于 2025-3-30 19:31:07
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DEMUR
发表于 2025-3-30 22:45:07
Alexander A. Dynkin M. Barron, M. J. Bickle, A. D. Chambers, J. D. Clemens, J. S. Daly, G. T. R. Droop, C. R. L. Friend, E. S. Grew, S. L. Harley, R. S. Harmon, N. B. W. Harris, B. Harte, T. J. B. Holland, N. F. C. Hudson, W. S. MacKenzie, W. Perkins, H. R. Rollinson, J. W. Sheraton, D. J. Waters, R. H. Worden and B.
medium
发表于 2025-3-31 01:41:11
Wolfram Schrettl Baker, L. M. Barron, M. J. Bickle, A. D. Chambers, J. D. Clemens, J. S. Daly, G. T. R. Droop, C. R. L. Friend, E. S. Grew, S. L. Harley, R. S. Harmon, N. B. W. Harris, B. Harte, T. J. B. Holland, N. F. C. Hudson, W. S. MacKenzie, W. Perkins, H. R. Rollinson, J. W. Sheraton, D. J. Waters, R. H. Worden and B. 978-94-015-3931-9978-94-015-3929-6
娴熟
发表于 2025-3-31 06:58:14
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MEEK
发表于 2025-3-31 13:11:34
Axel Lebahnan has highlighted inadequacies in the standardized test method. A simple material model and fracture criterion has been used, in conjunction with a previously introduced testpiece-bending model, to predict testing-induced interlaboratory scatter for the two nickel-base superalloys reported upon in
似少年
发表于 2025-3-31 13:43:29
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健忘症
发表于 2025-3-31 20:41:54
rence and guide for scientists and engineers engaged in the research on both the theoretical and practical aspects of high-solid and multi-phase bioprocess..978-981-13-3881-6978-981-10-6352-7Series ISSN 2196-6982 Series E-ISSN 2196-6990
缩减了
发表于 2025-4-1 01:11:50
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