Deflated
发表于 2025-3-21 19:50:38
书目名称Remembering Sofya Kovalevskaya影响因子(影响力)<br> http://impactfactor.cn/2024/if/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya影响因子(影响力)学科排名<br> http://impactfactor.cn/2024/ifr/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya网络公开度<br> http://impactfactor.cn/2024/at/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya网络公开度学科排名<br> http://impactfactor.cn/2024/atr/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya被引频次<br> http://impactfactor.cn/2024/tc/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya被引频次学科排名<br> http://impactfactor.cn/2024/tcr/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya年度引用<br> http://impactfactor.cn/2024/ii/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya年度引用学科排名<br> http://impactfactor.cn/2024/iir/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya读者反馈<br> http://impactfactor.cn/2024/5y/?ISSN=BK0826831<br><br> <br><br>书目名称Remembering Sofya Kovalevskaya读者反馈学科排名<br> http://impactfactor.cn/2024/5yr/?ISSN=BK0826831<br><br> <br><br>
激怒某人
发表于 2025-3-21 21:06:01
https://doi.org/10.1007/978-0-85729-929-119th century mathematics; Sofya Kovalevskaya
内向者
发表于 2025-3-22 02:11:29
http://reply.papertrans.cn/83/8269/826831/826831_3.png
agnostic
发表于 2025-3-22 06:56:42
http://reply.papertrans.cn/83/8269/826831/826831_4.png
AXIS
发表于 2025-3-22 10:02:16
http://reply.papertrans.cn/83/8269/826831/826831_5.png
逢迎春日
发表于 2025-3-22 13:39:47
http://reply.papertrans.cn/83/8269/826831/826831_6.png
Fresco
发表于 2025-3-22 17:28:18
http://reply.papertrans.cn/83/8269/826831/826831_7.png
吹牛大王
发表于 2025-3-22 22:55:51
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic
Pelvic-Floor
发表于 2025-3-23 02:33:19
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic
钩针织物
发表于 2025-3-23 05:43:36
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic